What can SIMS detect?
Is SIMS a destructive technique?
Secondary ion mass spectroscopy (SIMS) is a destructive analytical technique in which material is removed from a surface by ion beam sputtering, and the resultant positive and negative ions are mass analyzed in a mass spectrometer .
What is ToF SIMS analysis?
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. ... Analytical capabilities of ToF-SIMS include: Mass resolution of 0.00x amu.Sep 24, 2021
What is the difference between static and dynamic SIMS?
Static SIMS focuses solely on the first top monolayer, mostly for molecular characterization. Dynamic SIMS mode investigates bulk composition and in-depth distribution of trace elements, with a depth resolution from sub-nm to tens of nm. All CAMECA SIMS instruments are capable of dynamic SIMS.Jan 31, 2020
Why different ion beams are used in SIMS?
In "dynamic SIMS" mode the primary ion beam exceeds the "static limit" (~1E12 ions/cm2) producing a high yield of secondary ions. This technique is used for "bulk" analysis of elements and isotopes, and is particularly well-suited for analysis of isotopes and trace elements in minerals (e.g. REE in garnet).
What can ICP detect?
It is known and used for its ability to detect metals and several non-metals in liquid samples at very low concentrations. It can detect different isotopes of the same element, which makes it a versatile tool in isotopic labeling.
What are NanoSIMS for?
NanoSIMS (Nanoscale secondary ion mass spectrometry) is an analytical instrument manufactured by CAMECA which operates on the principle of secondary ion mass spectrometry. The NanoSIMS is used to acquire nanoscale resolution measurements of the elemental and isotopic composition of a sample.
What is depth profiling?
Depth Profiling is a process where the element or chemical content of a sample is measured as a function of depth. ... The depth profile process involves the repeated removal (or in certain cases, the movement of the sample) down to the desired depth.
How does a depth profile may get obtained on SIMS?
SIMS Depth Profiling
Thus a depth profile of a sample may be obtained simply by recording sequential SIMS spectra as the surface is gradually eroded away by the incident ion beam probe.Mar 28, 2021
How does time of flight mass spectrometry work?
A common form of mass spectrometry is time of flight (ToF) mass spectrometry. In this technique, particles of the substance are ionised to form 1+ ions which are accelerated so that they all have the same kinetic energy. The time taken to travel a fixed distance is then used to find the mass of each ion in the sample.
What elements of the periodic table can SIMS detect?
The SIMS technique provides a unique combination of extremely high sensitivity for all elements from Hydrogen to Uranium and above (detection limit down to ppb level for many elements), high lateral resolution imaging (down to 40 nm), and a very low background that allows high dynamic range (more than 5 decades).
How does secondary ion mass spectrometry work?
Secondary ion mass spectrometry (SIMS) is a technique used to analyze compositions of thin films and surfaces by using a focused primary ion beam to sputter the surface of a sample and analyze the ejected secondary ions.
What does SIM mean in chemistry?
Microprobe. Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.
How does a mass spectrometer work?
A mass spectrometer can measure the mass of a molecule only after it converts the molecule to a gas-phase ion. To do so, it imparts an electrical charge to molecules and converts the resultant flux of electrically charged ions into a proportional electrical current that a data system then reads.
How does ion mobility spectrometry work?
In an ion mobility spectrometer, organic molecules are ionized and driven by an electric field against a counterflow of neutral drift gas. In their way to the detector, the ions collide multiple times with the drift gas, which reduce their speed. After each collision, ions are accelerated again by the imposed field.
What is secondary ion mass spectrometer (SIMS)?
- What is Secondary Ion Mass Spectrometer (SIMS) As a class, SIMS instruments (aka ion microprobes) use an internally generated beam of either positive (e.g., Cs) or negative (e.g., O) ions (primary beam) focused on a sample surface to generate ions that are then transferred into a mass spectrometer across a high electrostatic potential, ...
What is the basic principle of SIMS analysis?
- Principle of SIMS Analysis Bombardment of a sample surface with a primary ion beam (I p) followed by mass spectrometry of the emitted secondary ions (I
What are the technical specifications of simsims?
- SIMS Technical Specifications 1 Signal Detected: Secondary ions 2 Elements Detected: H-U including isotopes 3 Detection Limits: >1E10 to 1E16 atoms/cm 3 4 Depth Resolution: >5 Å 5 Imaging/Mapping: Yes 6 Lateral Resolution/Probe Size: ≥10 µm (depth profiling); 1 µm (imaging mode)
What is retrospective analysis in TOF SIMS?
- Retrospective analysis. Every pixel of a ToF-SIMS map represents a full mass spectrum. This allows an analyst to retrospectively produce maps for any mass of interest, and to interrogate regions of interest (ROI) for their chemical composition via computer processing after the dataset has been instrumentally acquired.